Board Test System
得邁斯科技提供多種專業電路板測試系統，包括電路板測試系統 QT200NXG、電路板測試系統 QT200NXT、電路板測試系統 V250、電路板測試系統 BoardWalker 9627...等，歡迎您來信(電)洽詢！
Board Test System QT200NXG
• High-speed USB interface for plug and play
• Digital and analog functional testing
• Programmable derive and sense levels
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• Advanced Qmax signature method testing with Best fit Curve unique software algorithm
• In-built-boundary Scan controller and optional integrated BS Test Software.
• Greater library strength
• RCV measurement and oscilloscopes utilities
• Automatic Board Under Test Power Control.
• Circuit Tracing facility For generating net list Information.
• Industry standard Simulator for developing New Device Program
• Automatic pullup and pull down for testing Open collector and Open emitter devices.
• Digital and analog functional testing
• Programmable derive and sense levels
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• Advanced Qmax signature method testing with Best fit Curve unique software algorithm
• In-built-boundary Scan controller and optional integrated BS Test Software.
• Greater library strength
• RCV measurement and oscilloscopes utilities
• Automatic Board Under Test Power Control.
• Circuit Tracing facility For generating net list Information.
• Industry standard Simulator for developing New Device Program
• Automatic pullup and pull down for testing Open collector and Open emitter devices.
Board Test System BOARDWALKER 9627
• High-speed USB interface for plug and play
• VHDL based Device Library
• Programmable time base.
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• User defined analog stimulus QSM VI with Best fit Curve unique software algorithm.
• Integrated Boundary scan controller
• Python TD for effective analog device testing
• Inbuilt design Rule checker
• VHDL based Device Library
• Programmable time base.
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• User defined analog stimulus QSM VI with Best fit Curve unique software algorithm.
• Integrated Boundary scan controller
• Python TD for effective analog device testing
• Inbuilt design Rule checker
Board Test System QT200NXT
• Inbuilt Computer with i3 processor.
• Integrated 12 inch Touch screen industrial monitor
• Digital and analog functional testing
• Programmable derive and sense levels
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• Advanced Qmax signature method testing with Best fit Curve unique software algorithm
• In-built-boundary Scan controller and optional integrated BS Test Software.
• Greater library strength
• RCV measurement and oscilloscopes utilities
• Automatic Board Under Test Power Control.
• Circuit Tracing facility For generating net list Information.
• Industry standard Simulator for developing New Device Program
• Automatic pullup and pull down for testing Open collector and Open emitter devices
• Integrated 12 inch Touch screen industrial monitor
• Digital and analog functional testing
• Programmable derive and sense levels
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• Advanced Qmax signature method testing with Best fit Curve unique software algorithm
• In-built-boundary Scan controller and optional integrated BS Test Software.
• Greater library strength
• RCV measurement and oscilloscopes utilities
• Automatic Board Under Test Power Control.
• Circuit Tracing facility For generating net list Information.
• Industry standard Simulator for developing New Device Program
• Automatic pullup and pull down for testing Open collector and Open emitter devices
Board Test System V250
• Incircuit functional test for Digital , analog and mixed signal devices.
• User friendly and powerful Qmax TD6 software.
• QSMVI learn and compare with auto BEST curve fit.
• RLCV and F measurements.
• Board Functional test with automatic guided probe backtracking.
• DC parametric measurements.
• Integrated boundary scan test.
• PXI instrumentation ready.
• Faulty Simulation for TPS validation and test comprehensiveness.
• Faulty dictionary for nil or minimized internal node probing.
• User friendly and powerful Qmax TD6 software.
• QSMVI learn and compare with auto BEST curve fit.
• RLCV and F measurements.
• Board Functional test with automatic guided probe backtracking.
• DC parametric measurements.
• Integrated boundary scan test.
• PXI instrumentation ready.
• Faulty Simulation for TPS validation and test comprehensiveness.
• Faulty dictionary for nil or minimized internal node probing.